Handheld XRF for Art and Archaeology

List of Tables

15 List of Tables (with partial captions) Table. 1.1 Number of publications including the terms “Portable XRF”, “Handheld XRF”, and “XRF” in the AATA database. 19 Table 2.1: Surrogate calculated values for Kevex and Tracer with current custom and factory calibrations. 41 Table 2.2: Calculated LOD and LOQ using RSD power regression method and pure copper analysis. 55 Table 2.3: Current calibration vs. factory fit measurements. 57 Table 2.4: Comparison of quantitative analysis of Renaissance bronzes using Tracer and Kevex. 58 Table 2.5: Effect of acquisition time on elemental precision of Tracer. 63 Table 3.1: Main sources of analytical signal encountered during XRF analysis of photographs. 83 Table 3.2: A partial list of handheld XRF spectrometers on the market today. 84 Table 3.3: XRF detection limits of selected elements (to the nearest 0.5mg/cm2 ). 89 Table 3.4: Partial list of potential spectral interferences. 91 Table 3.5: XRF analysis of bulk and thin film standards (tfs). 104 Table 3.6: Components of the GCI portable laboratory. 127 Table 5.1: Elements detectable by handheld XRF for pigments most commonly encountered in manuscript illuminations. 166 Table 5.2: Possible source(s) of elements commonly detected in manuscript illuminations. 167 Table 6.1: The elemental slope and constant corrections used for the X-ray lines of interest. 203 Table 6.2: Indication of the estimated standard deviation based on scan time and the relative thickness number (based on the Beer-Lambert law). 204 Table 6.3: Both the accuracy and precision of analysis are presented for Al, S, K, Ca, and Fe. 206 Table 6.4: Limit of detection of Al, S, K, Ca, and Fe based on scan time. 207 Table 7.1: X-ray line energies and emission depths from a pure silver matrix relevant to silver alloy quantification. 220 Table 7.2: Compositions for the undersides of silver tankards from Winterthur’s collection compared to their presentation surfaces. 223 Table 7.3: Secondary calibration standards used to produce Winterthur’s copper-silver alloy empirical XRF calibrations. 227 Table 7.4: Quantitative XRF results for lightly tarnished silver coupon (incipient tarnish) versus freshly polished silver coupon. 230 Table 7.5: Relevant silver alloy standards for eighteenth- and nineteenth-century silver made and used in America. 234 Table 7.6: XRF Analysis of New York Historical Society hollow wares, Bruker Keymaster III-V. 242 Table 8.1: X-ray beam diameter information for some handheld XRF systems. 253 Table 8.2: Examples of bulk compositions of hard- and soft-paste porcelain bodies. 255 Table 8.3: Examples of bulk compositions of clear or white glaze layers on hard- and soft-paste porcelain bodies. 256 16 Table 8.4: Alkali and alkaline earth oxide components of clear and white glazes and the impact of excluding soda and magnesia from the calculation of molar ratios that help classify glazes based on the dominant network modifier. 260 Table 8.5: Values for the critical (infinite) thickness for analytes of interest in the porcelain body, clear glaze layer and an overglaze blue color. 262 Table 8.6: Weight percent oxide composition values used to calculate the critical (infinite) thickness and analysis depth values in Table 5. 280 Table 8.7: Elements used for the decoration of porcelain through the ages. 283 Table 8.8: Mean values for Böttger and Meissen porcelain body composition determined by Bezur and Casadio (2009) and Schulle and Ullrich (1982, table 2, 45). 290 Table 8.9: Mean oxide composition of porcelain paste groups identified by Bezur and Casadio (2009) using K-means cluster analysis. 292 Table 9.1: Range in densities of various woods from 0.11 – 0.9 103 kg/m3 (The Engineering Toolbox 2011). 329 Table 9.2: Selection of reference materials prepared from PE and PVC. 334 Table 9.3: Sample composition (type of skin, type of arsenical pesticide and method of application) and detectable penetration depth of the treatment into the skin. 337 Table 10.1: NIST Standard Reference Materials used for calibration verification – certified values. 358 Table 10.2: Summary of XRF data for hypocaust tiles. 367 Table 12.1: Minimum and maximum concentrations for standards used in extended MURR XRF calibration. 408 Table 12.2: Mean and standard deviations (in ppm by XRF) for some of the major sources in New Mexico for both the Berkeley Lab and MURR. 411 Table 13.1: XRF analyzing crystals and their suggested uses during analysis...