In lieu of an abstract, here is a brief excerpt of the content:

Bibliography Abbott, Andrew Delano. 1988. The System of Professions: An Essay on the Division of Expert Labor. University of Chicago Press. Akera, Atsushi. 2007. Calculating a Natural World: Scientists, Engineers, and Computers during the Rise of U.S. Cold War Research. MIT Press. Albrecht, T. R., H. A. Mizes, J. Nogami, Sang-il Park, and C. F. Quate. 1988a. Observation of Tilt Boundaries in Graphite by Scanning Tunneling Microscopy and Associated Multiple Tip Effects. Applied Physics Letters 52 (5): 362. Albrecht, T. R., M. M. Dovek, C. A. Lang, P. Grütter, C. F. Quate, S. W. J. Kuan, C. W. Frank, and R. F. W. Pease. 1988b. Imaging and Modification of Polymers by Scanning Tunneling Microscopy and Atomic Force Microscopy. Journal of Applied Physics 64 (3): 1178–1184. Albrecht, T. R., S. Akamine, T. E. Carver, and C. F. Quate. 1990. Microfabrication of Cantilever Styli for the Atomic Force Microscope. Journal of Vacuum Science & Technology A 8 (4): 3386–3396. Alexander, S., L. Hellemans, O. Marti, J. Schneir, V. Elings, P. K. Hansma, M. Longmire , and J. Gurley. 1989. An Atomic-Resolution Atomic-Force Microscope Implemented Using an Optical Lever. Journal of Applied Physics 65 (1): 164. Anderson, Bill, and Hakan Yuce. 1990. Optical-Fiber Reliability. Bellcore Exchange, October: 8–13. Anonymous. 1967. The Ultramicrometer: New Measuring Tool. Machinery 73 (12): 102–104. Anonymous. 1995. Veeco SXM® Atomic Force Microscope Used for Advanced Submicron Applications. Business Wire, February 6. 234 Bibliography Anonymous. 1998. Veeco Completes Merger with Digital Instruments; Appoints New Members to Board of Directors. Business Wire, May 29. Anonymous. 1999. Zygo and IBM Sign Additional Worldwide Distribution Agreement for IBM Production Line Atomic Force Microscope. Business Wire, January 12. Anonymous. 2000. Veeco Instruments Purchases IBM’s Atomic Force Microscope Assets. Business Wire, March 27. Anonymous. 2002. Veeco Came, Saw, Acquired Majority of the AFM Market. Small Times, October 8. Anonymous. 2007a. Question and Answer: Virgil Elings. Convergence (http://con vergence.ucsb.edu/article/question-and-answer-virgil-elings). Anonymous. 2007b. 2007 Annual Report on Form 10-K. Veeco. Asner, Glen Ross. 2006. The Cold War and American Industrial Research. Ph.D. dissertation , Carnegie Mellon University. Baird, Davis, and Ashley Shew. 2004. Probing the History of Scanning Tunneling Microscopy. In Discovering the Nanoscale, ed. D. Baird, A. Nordmann, and J. Schummer . IOS Press. Barabási, Albert-László, and Réka Albert. 1999. Emergence of Scaling in Random Networks . Science 286 (5439) (October 15): 509–512. Barad, Karen. 1999. Agential Realism: Feminist Interventions in Understanding Scientific Practices. In The Science Studies Reader, ed. M. Biagioli. Routledge. Barnes, Barry, David Bloor, and John Henry. 1996. Scientific Knowledge: A Sociological Analysis. University of Chicago Press. Baro, A. M., R. Miranda, J. Alaman, N. Garcia, G. Binnig, H. Rohrer, C. Gerber, and J. L. Carrascosa. 1985. Determination of Surface Topography of Biological Specimens at High Resolution by Scanning Tunnelling Microscopy. Nature 315 (6016) (May 16): 253–254. Bassett, Ross Knox. 2002. To the Digital Age: Research Labs, Start-up Companies, and the Rise of MOS Technology. Johns Hopkins University Press. Beaulieu, Anne. 2010. From Co-Location to Co-Presence: Shifts in the Use of Ethnography for the Study of Knowledge. Social Studies of Science 40: 453–470. [18.224.149.242] Project MUSE (2024-04-20 03:38 GMT) Bibliography 235 Beebe, T. P., T. E. Wilson, D. F. Ogletree, J. E. Katz, R. Balhorn, M. B. Salmeron, and W. J. Siekhaus. 1989. Direct Observation of Native DNA Structures with the Scanning Tunneling Microscope. Science 243 (4889) (January 20): 370–372. Bennett, P. A., L. C. Feldman, Y. Kuk, E. G. McRae, and J. E. Rowe. 1983. StackingFault Model for the Si(111)-(7×7) surface. Physical Review B 28 (6): 3656. Bijker, Wiebe E. 1995. Of Bicycles, Bakelites, and Bulbs: Toward a Theory of Sociotechnical Change. MIT Press. Binnig, G. 1992. Force Microscopy. Ultramicroscopy 42–44 (1): 7–15. Binnig, G., H. Rohrer, C. Gerber, and E. Weibel. 1982. Surface Studies by Scanning Tunneling Microscopy. Physical Review Letters 49 (1) (July 5): 57. Binnig, G., H. Rohrer, C. Gerber, and E. Weibel. 1983. 7×7 Reconstruction on Si(111) Resolved in Real Space. Physical Review Letters 50 (2): 120. Binnig, Gerd, and Heinrich Rohrer. 1984. Scanning Tunneling Microscopy. In Trends in Physics, ed. J. Jant and J. Pantolicek. European Physical Society. Binnig, Gerd, and Heinrich Rohrer. 1986. Scanning Tunneling Microscopy. IBM Journal of Research and Development 30 (4): 355–369. Binnig, Gerd, and Heinrich Rohrer. 1987. Scanning...

Share